Proceedings of the 6th International Conference on Electronic, Mechanical, Information and Management Society

How to Stop Chinglish

Authors
Weixiang Liu, Li Li
Corresponding Author
Weixiang Liu
Available Online April 2016.
DOI
10.2991/emim-16.2016.49How to use a DOI?
Keywords
Chinglish; Language transfer; Writing; Causes; Countermeasures
Abstract

Chinglish is a pragmalinguistic failure caused by the interference of Chinese, culture and thinking mode and the similar condition is that English students use the wrong in Chinese writing. The research finds out that Chinglish is common in English writing. This paper combines language transfer, comparison, and error analysis to analyze the reason of pragmalinguistic failure and appearance of Chinglish as well as the characteristics and causes of Chinese-style vocabulary, syntax and discourse structure so as to come up with relative writing teaching strategies. Furthermore, this paper expects to provide references for relative teaching practices in order to correct and reduce the errors to finally improve writing skills.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 6th International Conference on Electronic, Mechanical, Information and Management Society
Series
Advances in Computer Science Research
Publication Date
April 2016
ISBN
978-94-6252-176-6
ISSN
2352-538X
DOI
10.2991/emim-16.2016.49How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Weixiang Liu
AU  - Li Li
PY  - 2016/04
DA  - 2016/04
TI  - How to Stop Chinglish
BT  - Proceedings of the 6th International Conference on Electronic, Mechanical, Information and Management Society
PB  - Atlantis Press
SP  - 224
EP  - 226
SN  - 2352-538X
UR  - https://doi.org/10.2991/emim-16.2016.49
DO  - 10.2991/emim-16.2016.49
ID  - Liu2016/04
ER  -