A Method of Extended Testability Modeling Based on Fault Injection System

DOI

10.2991/emeit.2012.476How to use a DOI?

Keywords

Fault injection, testability modeling, on-off multi-state system, extended D matrix, extended diagnostic tree

Abstract

Presently, the slowly development of DFT is mainly due to the lack of effective testability validation. The validation is an important part of the DFT, it will accurately detect equipment Fault Detection Rate (FDR), Fault Isolation Rate (FIR), Fault Alarm Rate (FAR) and make sure other important indicators of the test. Fault injection techniques have become the core of the DFT validation. It directly introduces faults (hardware or software) into the target equipment systems by means of artificial. Thereby it reduces the failure of the incubation period, and accelerates the process of system failure. Testability-modeling is an effective method if fault injection. The existing methods for testability-modeling have some constraints, including the consistency of failure criterion, failure transmitting and logical-value criterion of test. Aiming at states differences of on-off multi-state system, the method of extended testability modeling was proposed. Failure, test, D matrix and diagnostic tree were defined extended with the introduction of states, and an extended testability model was defined also. The algorithms for extended testability modeling and analysis were described, which include modeling, generations of extended D matrix and extended diagnostic tree. A hydraulic control system is taken as an example for the engineering application, which shows that this method is feasible and effective.

Copyright

© 2012, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - CONF
AU  - Zhiyu Li
AU  - Kaoli Huang
AU  - Guangyao Lian
PY  - 2012/09
DA  - 2012/09
TI  - A Method of Extended Testability Modeling Based on Fault Injection System
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 2151
EP  - 2154
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.476
DO  - 10.2991/emeit.2012.476
ID  - Li2012/09
ER  -