Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

Effect of strain rate on cyclic deformation behavior of a beta phase containing TiAl alloy at elevated temperature

Authors
Hongfu Xiang, Anlun Dai, Hui Li, Jiheng Wang, Jinghai Tao
Corresponding Author
Hongfu Xiang
Available Online September 2012.
DOI
10.2991/emeit.2012.346How to use a DOI?
Keywords
Titanium aluminum compound, isothermal fatigue, strain rate, cyclic stress-strain response
Abstract

A beta phase containing titanium aluminum compound was prepared. Isothermal Fatigue(IF) were subjected at 650 at three strain rates, such as 6.67×10-3 s-1, 6.67×10-4 s-1, 6.67×10-5 s-1 to determine the effect of strain rate on cyclic stress-strain response (CSSR) of TiAl alloy during IF tests. The curves of cyclic stress-strain response were also discussed. The results show that strain rates have an apparent effect on CSSR of TiAl alloy during IF tests.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
978-90-78677-60-4
ISSN
1951-6851
DOI
10.2991/emeit.2012.346How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Hongfu Xiang
AU  - Anlun Dai
AU  - Hui Li
AU  - Jiheng Wang
AU  - Jinghai Tao
PY  - 2012/09
DA  - 2012/09
TI  - Effect of strain rate on cyclic deformation behavior of a beta phase containing TiAl alloy at elevated temperature
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 1558
EP  - 1561
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.346
DO  - 10.2991/emeit.2012.346
ID  - Xiang2012/09
ER  -