Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)

Measuring method and sample size selection for the magnetostriction measurement of silicon steel

Authors
Yechao Zhu, Ningyuan Dang, Xiaolong Guo, Yong Lin
Corresponding Author
Yechao Zhu
Available Online September 2012.
DOI
10.2991/emeit.2012.284How to use a DOI?
Keywords
magnetostriction, silicon steel, stability, repeatability, strain
Abstract

Magnetostriction of silicon steel is the main cause of the noise of transformer, while its measuring method is argumentative. It was investigated in this paper the effect of sample size on the measuring stability and reproducibility using laser displacement meter method. It was found that for the sample size 100mm×500mm the measuring stability and repeatability are the best comparing to the size of 30mm×300mm, 30mm×100mm and 60mm×100mm. For samples with the above for sizes cutting from the same sheet, the magnetostriction of 100mm×500mm size sample is the smallest.

Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
Series
Advances in Intelligent Systems Research
Publication Date
September 2012
ISBN
10.2991/emeit.2012.284
ISSN
1951-6851
DOI
10.2991/emeit.2012.284How to use a DOI?
Copyright
© 2012, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Yechao Zhu
AU  - Ningyuan Dang
AU  - Xiaolong Guo
AU  - Yong Lin
PY  - 2012/09
DA  - 2012/09
TI  - Measuring method and sample size selection for the magnetostriction measurement of silicon steel
BT  - Proceedings of the 2nd International Conference on Electronic & Mechanical Engineering and Information Technology (EMEIT 2012)
PB  - Atlantis Press
SP  - 1283
EP  - 1286
SN  - 1951-6851
UR  - https://doi.org/10.2991/emeit.2012.284
DO  - 10.2991/emeit.2012.284
ID  - Zhu2012/09
ER  -