Proceedings of the 3rd International Conference on Electric and Electronics

Stability Characteristics and De-icing Modes Analysis of JinSu UHVDC Transmission Line

Authors
Jianming Wang, Yonghua Yin, Jian Zhang
Corresponding Author
Jianming Wang
Available Online December 2013.
DOI
10.2991/eeic-13.2013.88How to use a DOI?
Keywords
JinSu UHVDC; coupling characteristics; coordinated control strategy; de-icing mode
Abstract

After the operation of JinSu UHVDC transmission line, influence on the stability of the interconnected power grid especially in de-icing modes is studied from various sides. To cope with the DC block fault occurred in the UHVDC transmission line, the coordinated control strategy based on emergency DC power supply is researched, by which the total amount of load shedding and generator tripping can be reduced. According to the comparison and selection of generator tripping schemes, the voltage rise near sending-end after DC block fault is taken into account. The influence on power system stability is analyzed in two UHVDC de-icing modes. The feasibility and validity of these de-icing modes is proved.

Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 3rd International Conference on Electric and Electronics
Series
Advances in Intelligent Systems Research
Publication Date
December 2013
ISBN
10.2991/eeic-13.2013.88
ISSN
1951-6851
DOI
10.2991/eeic-13.2013.88How to use a DOI?
Copyright
© 2013, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Jianming Wang
AU  - Yonghua Yin
AU  - Jian Zhang
PY  - 2013/12
DA  - 2013/12
TI  - Stability Characteristics and De-icing Modes Analysis of JinSu UHVDC Transmission Line
BT  - Proceedings of the 3rd International Conference on Electric and Electronics
PB  - Atlantis Press
SP  - 376
EP  - 379
SN  - 1951-6851
UR  - https://doi.org/10.2991/eeic-13.2013.88
DO  - 10.2991/eeic-13.2013.88
ID  - Wang2013/12
ER  -