Cell Culture and Trapping of Yeast Protoplasts Using Au Thin-Film Dielectrophoresis Chip
- DOI
- 10.2991/eame-15.2015.18How to use a DOI?
- Keywords
- dielectrophoresis; Au thin-film; yeast cell; protoplast; fusion and cell culture
- Abstract
Dielectrophoresis (DEP) force will arise when an inhomogeneous AC electric field with sinusoidal wave form is applied to micro electrodes. The DEP is able to distinguish between viable and non-viable biological cells by their movement through a non-uniform electric field. The viable cells can be used for analytic chemistry, cell culture or fusion. The aim of this research is yeast cell culture after distinction of viable and non-viable cells on Au thin-film DEP chip. We fabricated a planar double pole electrode for DEP using Au thin-film and a box cutter. This fabrication method is low cost and simpler than the previous existing methods. We observed cell culture under the terms of DEP (1Vpp-5MHz) after distinction between viable and non-viable yeast cells. The Au thin-film DEP chip could obtain viable cells which were trapped at the micro electrodes. The daughter cell became as big as the mature cells after about 50 minutes of observation. In other experiments, we confirmed whether the Au thin-film DEP chip can trap yeast protoplasts or not. When we applied 4Vpp and over 40kHz, the yeast protoplasts were trapped at the micro electrode. This experimental result is very important for performing fusion of cells. We confirmed usefulness and possibility of Au thin-film DEP chip through these experiments.
- Copyright
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - K. Nishimoto AU - K. Taguchi AU - K. Aritoshi PY - 2015/07 DA - 2015/07 TI - Cell Culture and Trapping of Yeast Protoplasts Using Au Thin-Film Dielectrophoresis Chip BT - Proceedings of the 2015 International Conference on Electrical, Automation and Mechanical Engineering PB - Atlantis Press SP - 67 EP - 70 SN - 2352-5401 UR - https://doi.org/10.2991/eame-15.2015.18 DO - 10.2991/eame-15.2015.18 ID - Nishimoto2015/07 ER -