Proceedings of the International Conference on Computer Information Systems and Industrial Applications

Abrasiveness Calibration of Optical Measuring Wheel

Authors
J.Y Shieh, W.C Huang, Y.T Liu, G.J Liao
Corresponding Author
J.Y Shieh
Available Online June 2015.
DOI
10.2991/cisia-15.2015.97How to use a DOI?
Keywords
measuring wheel; wheel wear; microcontroller; infrared ranging module for distance measurement; encoder
Abstract

The aim of this study is to propose a simple operation and highly practical measuring instrument. In response to conventional mechanical measuring wheels that mainly measure distance mechanically and inspect wheel wear visually, however, they are unable to monitor it effectively. As the wheel tends to generate wheel problems over time, it will gradually cause inaccurate distance measurement. Thus, a Holtek microcontroller HT66F50 was adopted to allow it to have a measuring function by coordinating with an infrared ranging module and an incremental encoder. Besides, Measurement System Analysis was further conducted to verify whether or not this measuring system is able to comply with the measurement system specifications.

Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Download article (PDF)

Volume Title
Proceedings of the International Conference on Computer Information Systems and Industrial Applications
Series
Advances in Computer Science Research
Publication Date
June 2015
ISBN
978-94-62520-72-1
ISSN
2352-538X
DOI
10.2991/cisia-15.2015.97How to use a DOI?
Copyright
© 2015, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - J.Y Shieh
AU  - W.C Huang
AU  - Y.T Liu
AU  - G.J Liao
PY  - 2015/06
DA  - 2015/06
TI  - Abrasiveness Calibration of Optical Measuring Wheel
BT  - Proceedings of the International Conference on Computer Information Systems and Industrial Applications
PB  - Atlantis Press
SP  - 356
EP  - 358
SN  - 2352-538X
UR  - https://doi.org/10.2991/cisia-15.2015.97
DO  - 10.2991/cisia-15.2015.97
ID  - Shieh2015/06
ER  -