Abrasiveness Calibration of Optical Measuring Wheel
J.Y Shieh, W.C Huang, Y.T Liu, G.J Liao
Available Online June 2015.
- 10.2991/cisia-15.2015.97How to use a DOI?
- measuring wheel; wheel wear; microcontroller; infrared ranging module for distance measurement; encoder
The aim of this study is to propose a simple operation and highly practical measuring instrument. In response to conventional mechanical measuring wheels that mainly measure distance mechanically and inspect wheel wear visually, however, they are unable to monitor it effectively. As the wheel tends to generate wheel problems over time, it will gradually cause inaccurate distance measurement. Thus, a Holtek microcontroller HT66F50 was adopted to allow it to have a measuring function by coordinating with an infrared ranging module and an incremental encoder. Besides, Measurement System Analysis was further conducted to verify whether or not this measuring system is able to comply with the measurement system specifications.
- © 2015, the Authors. Published by Atlantis Press.
- Open Access
- This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).
Cite this article
TY - CONF AU - J.Y Shieh AU - W.C Huang AU - Y.T Liu AU - G.J Liao PY - 2015/06 DA - 2015/06 TI - Abrasiveness Calibration of Optical Measuring Wheel BT - Proceedings of the International Conference on Computer Information Systems and Industrial Applications PB - Atlantis Press SP - 356 EP - 358 SN - 2352-538X UR - https://doi.org/10.2991/cisia-15.2015.97 DO - 10.2991/cisia-15.2015.97 ID - Shieh2015/06 ER -