Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Analysis of lighting withstand level and flashover phases of tower double circuit transmission line

Authors
Dongmin Xi, Dan Zhang, Jiachen Liu
Corresponding Author
Dongmin Xi
Available Online November 2016.
DOI
10.2991/aest-16.2016.92How to use a DOI?
Keywords
tower double circuit; flashover phases; ATP-EMTP; lighting withstand level.
Abstract

The overhead transmission lines stretching thousands of miles, accounted for a large part of power system, and lightning transmission line fault is the most main form of power system fault. In order to reduce the transmission corridor area, double circuit and even more loop transmission lines were more and more adopted, and therefore the tower is higher and higher. And the higher the tower, the greater the possibility of being struck by lightning. Thus it is very necessary to research and analyze the tower double circuit transmission line. The model of canal 110kV substation was established and the lighting withstands level and flashover phases were analyzed through the electric transient simulation program ATP-EMTP.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
978-94-6252-257-2
ISSN
1951-6851
DOI
10.2991/aest-16.2016.92How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Dongmin Xi
AU  - Dan Zhang
AU  - Jiachen Liu
PY  - 2016/11
DA  - 2016/11
TI  - Analysis of lighting withstand level and flashover phases of tower double circuit transmission line
BT  - Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
SP  - 691
EP  - 697
SN  - 1951-6851
UR  - https://doi.org/10.2991/aest-16.2016.92
DO  - 10.2991/aest-16.2016.92
ID  - Xi2016/11
ER  -