Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)

Chaotic characteristics analysis of simulation signal of ultrasonic nonlinear modulation effect

Authors
Hanying Mao, Yuhua Zhang, Hanling Mao, Zhenfeng Huang
Corresponding Author
Hanying Mao
Available Online November 2016.
DOI
10.2991/aest-16.2016.30How to use a DOI?
Keywords
nonlinear ultrasonic; nondestructive testing; chaos; Lyapunov exponent.
Abstract

The effectiveness of chaos and fractal theory in analyzing ultrasonic nonlinear modulation signal was theoretically verified and a new way of using chaos and fractal theory in nondestructive testing is provided based on the simulation signal of ultrasonic nonlinear modulation effect. By constructing the simulation signal of modulation effect, the simulation signal with the chaotic character was found, and the nonlinear parameter and characteristic values of chaos theory were calculated to analyze the nonlinearity of specimens. By comparisons, the conclusion could be found that the Lyapunov exponent was sensitive to weaker nonlinearity and unsusceptible to noise.

Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Volume Title
Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
Series
Advances in Intelligent Systems Research
Publication Date
November 2016
ISBN
978-94-6252-257-2
ISSN
1951-6851
DOI
10.2991/aest-16.2016.30How to use a DOI?
Copyright
© 2016, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - CONF
AU  - Hanying Mao
AU  - Yuhua Zhang
AU  - Hanling Mao
AU  - Zhenfeng Huang
PY  - 2016/11
DA  - 2016/11
TI  - Chaotic characteristics analysis of simulation signal of ultrasonic nonlinear modulation effect
BT  - Proceedings of the 2016 International Conference on Advanced Electronic Science and Technology (AEST 2016)
PB  - Atlantis Press
SP  - 229
EP  - 234
SN  - 1951-6851
UR  - https://doi.org/10.2991/aest-16.2016.30
DO  - 10.2991/aest-16.2016.30
ID  - Mao2016/11
ER  -