International Journal of Computational Intelligence Systems

Volume 8, Issue 2, April 2015, Pages 208 - 218

Identifying critical success factors in EDA industry using DEMATEL method

Authors
Chia-Chi Sun
Corresponding Author
Chia-Chi Sun
Received 12 June 2012, Accepted 23 March 2014, Available Online 1 April 2015.
DOI
https://doi.org/10.1080/18756891.2015.1001945How to use a DOI?
Keywords
EDA industry, Diamond mode, Critical Success Factors, Decision Making Trial and Evaluation Laboratory (DEMATEL), Mu1tiple criteria decision-making (MCDM)
Abstract

Electronic design automation (EDA) is a category of software tools for designing electronic systems such as printed circuit boards and integrated circuits. However, the EDA industry has been locked into virtually flat growth for the past several years. Time-to-market pressures and design complexity are critical challenges that EDA industry face today. With this background, this paper attempts to identify and analyze the Critical Success Factors (CSFs) in EDA industry. This research proposes the decision making trial and evaluation laboratory (DEMATEL) as the main analytical tool. The DEMATEL can be used as an effective method to handle the inner dependences within a set of criteria. Results show that the critical local demand condition and government are the causal competitive advantage factors for the EDA industry and could have the significant role in responding to the EDA industry. This paper draws on the research results for managerial practice implications and suggests some empirical tactics to enhance management performance for the EDA industry.

Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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Journal
International Journal of Computational Intelligence Systems
Volume-Issue
8 - 2
Pages
208 - 218
Publication Date
2015/04/01
ISSN (Online)
1875-6883
ISSN (Print)
1875-6891
DOI
https://doi.org/10.1080/18756891.2015.1001945How to use a DOI?
Copyright
© 2017, the Authors. Published by Atlantis Press.
Open Access
This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

Cite this article

TY  - JOUR
AU  - Chia-Chi Sun
PY  - 2015
DA  - 2015/04/01
TI  - Identifying critical success factors in EDA industry using DEMATEL method
JO  - International Journal of Computational Intelligence Systems
SP  - 208
EP  - 218
VL  - 8
IS  - 2
SN  - 1875-6883
UR  - https://doi.org/10.1080/18756891.2015.1001945
DO  - https://doi.org/10.1080/18756891.2015.1001945
ID  - Sun2015
ER  -