A Fast Implementation for the Typical Testor Property Identification Based on an Accumulative Binary Tuple

DOI

10.1080/18756891.2012.747657How to use a DOI?

Keywords

feature selection, tipycal testors, pattern recognition, logical combinatorial pattern recognition

Abstract

In this paper, we introduce a fast implementation of the CT EXT algorithm for testor property identification, that is based on an accumulative binary tuple. The fast implementation of the CT EXT algorithm (one of the fastest algorithms reported), is designed to generate all the typical testors from a training matrix, requiring a reduced number of operations. Experimental results using this fast implementation and the comparison with other state-of-the-art algorithms that generate typical testors are presented.

Copyright

© 2017, the Authors. Published by Atlantis Press.

Open Access

This is an open access article distributed under the CC BY-NC license (http://creativecommons.org/licenses/by-nc/4.0/).

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TY  - JOUR
AU  - Guillermo Sanchez-Diaz
AU  - Manuel Lazo-Cortes
AU  - Ivan Piza-Davila
PY  - 2012
DA  - 2012/11/01
TI  - A Fast Implementation for the Typical Testor Property Identification Based on an Accumulative Binary Tuple
JO  - International Journal of Computational Intelligence Systems
SP  - 1025
EP  - 1039
VL  - 5
IS  - 6
SN  - 1875-6883
UR  - https://doi.org/10.1080/18756891.2012.747657
DO  - 10.1080/18756891.2012.747657
ID  - Sanchez-Diaz2012
ER  -